作者：张蓓¹, 张建平²

作者单位：1. 上海电力大学能源与机械工程学院, 上海 200090;
2. 上海理工大学机械工程学院, 上海 200093

关键词：加速退化试验;寿命预测;加速系数;三参数威布尔函数;亮度衰减

摘要：

为在短时间内准确获得真空荧光显示器的寿命信息，该文在提高阴极灯丝温度的基础上开展四组恒定应力作用下的加速退化试验，利用加速时间与加速系数的关系将加速应下的试验数据转化为常规应力下的亮度衰减数据，基于三参数威布尔函数和右逼近法建立寿命预测模型，从而实现寿命的估算。结果表明，加速退化试验方案切实可行，基于亮度衰减的寿命模型不仅准确揭示亮度随时间的变化规律，而且具有较高的预测精度，可为制造商和用户提供技术参考，并可推广到其他光电产品。

Life prediction of VFD based on four groups of accelerated degradation tests
ZHANG Bei¹, ZHANG Jianping²
1. College of Energy and Mechanical Engineering, Shanghai University of Electric Power, Shanghai 200090, China;
2. School of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China
Abstract: Aiming at obtaining the life information of vacuum fluorescent display in a short time, accelerated degradation tests under four groups of constant stresses are carried out on the basis of increasing the temperature of the cathode filament. The relationship between accelerated time and the acceleration coefficient is applied to transform the test data at accelerated stress into the luminance attenuation data under normal stress, and the life prediction model based on three-parameter Weibull function and right approximation method is established, thus achieving the life estimation. The results indicate that the accelerated degradation test scheme is feasible, and the life model based on luminance attenuation not only accurately reveals the rule of brightness changing with time, but also has high prediction accuracy, which can provide manufacturers and users with important technical references and can be generalized to other optoelectronic products.
Keywords: accelerated degradation tests;life prediction;acceleration coefficient;three-parameter Weibull function;luminance attenuation
2020, 46(4):148-152  收稿日期: 2019-03-30;收到修改稿日期: 2019-05-27
基金项目: 国家自然科学基金项目（11572187）；上海市科学技术委员会项目（18DZ1202105，18DZ1202302）
作者简介: 张蓓(1993-),女,浙江宁波市人,硕士研究生,专业方向为寿命预测与可靠性研究
参考文献
[1] 张猛, 王瑞光, 郑喜凤. 基于AT89C52的VFD显示模块应用[J]. 液晶与显示, 2012, 27(1):93-97
[2] 李定珍, 王萍. VFD显示图像缺陷检测技术研究[J]. 液晶与显示, 2013, 28(1):138-145
[3] 邓爱民, 陈循, 张春华, 等. 加速退化试验技术综述[J]. 兵工学报, 2007, 28(8):1002-1007
[4] 骆明珠, 陈颖, 康锐. 基于PoF模型的电子产品可靠性参数计算方法[J]. 系统工程与电子技术, 2014, 36(4):795-801
[5] 崔晓英, 许燕, 黄云. GaAs PHEMT器件高温加速寿命试验及物理分析[J]. 电子器件, 2010, 33(1):22-26
[6] 夏云云, 文尚胜, 方方. 基于Kolmogorov-Smirnov检验的LED可靠性评估[J]. 光子学报, 2016, 45(9):26-31
[7] 徐欢, 刘桂雄, 余荣斌. 性能退化量分布LED可靠性评估[J]. 中国测试, 2016, 42(9):126-129
[8] HASSAN M U, DANISH F, YOUSUF W B, et al. Comparison of different life distribution schemes for prediction of crack propagation in an aircraft wing[J]. Engineering Failure Analysis, 2019, 96:241-254
[9] 王文知, 井红旗, 祁琼, 等. 大功率半导体激光器可靠性研究和失效分析[J]. 发光学报, 2017, 38(2):165-169
[10] ZHAI Q, CHEN P, HONG L, et al. A random-effects Wiener degradation model based on accelerated failure time[J]. Reliability Engineering & System Safety, 2018, 180:94-103
[11] HAO S, YANG J, BERENGUER C. Nonlinear step-stress accelerated degradation modelling considering three sources of variability[J]. Reliability Engineering & System Safety, 2018, 172:207-215
[12] PELLIZZI E, DERIEUX A L, LAVÉDRINE B, et al. Degradation of polyurethane ester foam artifacts:chemical properties, mechanical properties and comparison between accelerated and natural degradation[J]. Polymer Degradation & Stability, 2014, 107(9):255-261
[13] ZHANG J P, ZHANG X, ZONG Y, et al. Life prediction for a vacuum fluorescent display based on two improved models using the three-parameter weibull right approximation method[J]. Luminescence, 2018, 33(1):34-39
[14] 蔡忠义, 陈云翔, 李超, 等. 基于比例危险退化建模的产品可靠性评估方法[J]. 电光与控制, 2018, 25(3):64-67
[15] HU C H, LEE M Y, TANG J. Optimum step-stress accelerated degradation test for wiener degradation process under constraints[J]. European Journal of Operational Research, 2015, 241(2):412-421
[16] ZHANG J P, WANG R T. Reliability life prediction of VFD by constant temperature stress accelerated life tests and maximum likelihood estimation[J]. Journal of Testing & Evaluation, 2009, 37(4):316-320
[17] 王浩伟, 滕克难. 基于加速退化数据的可靠性评估技术综述[J]. 系统工程与电子技术, 2017, 39(12):2877-2885