作者：魏冬, 张志杰, 裴东兴

作者单位：中北大学仪器科学与动态测试教育部重点实验室, 山西太原 030051

关键词：电荷放大器; 可靠性; 失效率; MTBF; 故障树

摘要：

介绍了电荷放大器在存储测试系统中的作用,详细说明了电荷放大器工作原理,推导出电荷量与输出电压之间的关系。通过故障树的方法对电荷放大器的可靠性进行分析,得出电荷放大器的MTBF和可靠性曲线,定量计算出电阻、电容、焊点和芯片在一个完整的存储测试电路中的失效率,定性的分析出不同部分对整体系统失效率的影响度。

Reliability-analysis of charge amplifier

WEI Dong, ZHANG Zhi-jie, PEI Dong-xing

Key Laboratory of Instrumentation Science and Dyamic Measurement(Ministry of Education), North China University, Taiyuan 030051, China

Abstract: This paper introduced the function and operating principle of charge amplifier in the stored testing and measuring system and then derived the relation of charge and output-voltage.The reliability of charge amplifier was analyzed by fault tree.The MTBF and reliability-curve of charge amplifier was obtained.The miss ratio to a whole stored testing and measuring system of resistance,capacitance,weld and CMOS chip was calculated.The influence of difference parts to the miss ratio of whole system was analyzed qualitatively.

Keywords: Charge amplifier; Reliability; Miss ratio; MTBF; Fault tree

2007, 33(1): 86-87  收稿日期: 2006-4-8;收到修改稿日期: 2006-5-27

基金项目: 

作者简介: 

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