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首页>《中国测试》期刊>本期导读>一种FPGA的SEU效应测试方法研究

一种FPGA的SEU效应测试方法研究

570    2019-01-30

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作者:王志国, 孟令军, 张皓威, 张敏

作者单位:中北大学仪器与电子学院, 山西 太原 030051


关键词:FPGA;低空环境;单粒子翻转;树莓派;低压差分信号


摘要:

为对FPGA在低空环境下受高能粒子辐射而产生的单粒子翻转(SEU)进行失效统计,设计一种便携式实时FPGA的SEU效应测试系统。该系统采用FPGA作为主控模块,以树莓派作为上位机,通过长距离低压差分信号线远程连接到被测FPGA进行测试。上位机接收测试结果存储至SD卡,并实时显示到车载显示器,以供测试人员即时了解测试情况。经过在青藏高原实地测试,获得大量的现场数据。对测试结果进行分析,得到的大气中子剂量与FPGA的SEU事件概率之间的数值关系与预期一致。测试结果表明该便携式实时测试系统科学有效,可为低空飞行器的FPGA选型提供一定参考。


Study on a test method of FPGA SEU effect
WANG Zhiguo, MENG Lingjun, ZHANG Haowei, ZHANG Min
School of Instrument and Electronics, North University of China, Taiyuan 030051, China
Abstract: In order to perform the failure statistics of single event upset (SEU) on FPGA generated by high-energy particles radiation in a low altitude space, thus a portable and real-time FPGA SEU effect test system was designed. This system (which uses FPGA as the main control module, and Raspberry Pi as the upper computer) for testing remotely connects to the tested FPGA through a long-distance low voltage differential signal line. The test result was received by upper computer and then stored in the SD card, then displayed on vehicle screen so that the tester can know it in real time. After testing in the Qinghai-Tibet Plateau, a lot of field data was obtained. The relation between atmospheric neutron dose and the statistics of FPGA SEU events is consistent with the expectation after analyzing the test results. The test result shows that portable real-time FPGA SEU test system is scientific and effective, which provides some reference for FPGA selection of low altitude aircraft.
Keywords: FPGA;low altitude;single event upset;Raspberry Pi;LVDS
2019, 45(1):115-120  收稿日期: 2018-03-04;收到修改稿日期: 2018-04-02
基金项目: 航空科学基金项目(20128067003)
作者简介: 王志国(1991-),男,安徽亳州市人,硕士研究生,专业方向为动态测试技术
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