作者：陈剑, 刘卫国

作者单位：西安工业学院光电工程学院微系统研究所, 陕西西安 710032

关键词：介电材料; 方阻; 电阻温度系数; 测控系统

摘要：

介绍了在LabVIEW环境下开发测试程序VI(虚拟仪器)测试片状元件试样的方阻、电阻率以及电阻温度系数TCR随温度的变化关系,主要包括电阻温度特性测控系统的硬件构成,基于LabVIEW开发平台的测控软件框图及测试程序。该测试系统在-20℃~120℃温度范围内能够实现对元件试样的多点测试,升温方法采取线性升温,且升温速率可在0.1℃/min~10℃/min之间选择,测试结果对于介电材料性能的研究以及元器件开发都有一定的价值。

Measurement system for resistance temperature characteristic of dielectric material on LabVIEW

CHEN Jian, LIU Wei-guo

Photoelectricity Microsystems Graduate school of Xi'an Institute of Technology, Xi'an 710032, China

Abstract: This text introduced development of testing program VI(virtual instrument) on testing the changeable relationships among square resistance,electric resistance rate and electric resistance temperature coefficient TCR by LabVIEW.It put emphasis on system and software of detecting electric resistance temperature characteristic.This system can realize several-point testing within temperature range from-20℃ to +120℃.Meanwhile,as this system use liner heating method,the heating rate can be controlled from 0.1℃ min to 10℃ min.Testing result shows great value on research of characteristic of dielectric material as well as development of electric parts.

Keywords: Dielectric materials; Square resistance; Resistance temperature coefficient; Control system

2006, 32(5): 66-68  收稿日期: 2005-11-20;收到修改稿日期: 2006-1-25

基金项目: 

作者简介: 

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